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The ParticleSCAN VP Scanning Electron Microscope from Carl Zeiss SMT with an integrated liquid nitrogen free EDS system, is a dedicated process analysis tool for the production environment.
Its rugged design and construction enable use on the factory floor instead of a dedicated analysis laboratory. The system has minimal environmental constraints and can be installed and running samples in less than an hour.
Remote diagnostic capabilities allow rapid and focused technical support to maximise the system up time required by a tool which can be an essential part of the manufacturing control process.
Carl Zeiss SMT created the market for automatic particle analysis systems by monitoring wear debris in engine oil to determine the health of high performance engines.
This expertise is now implemented in the powerful SmartPI™ (Particle Investigator) software available on the new ParticleSCAN system and can be tailored for a wide range of particulate analyses from pharmaceutical powders to steel inclusions.
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ParticleSCAN VP Applications
A wide range of routine particle analysis applications including:
- Clean manufacturing
- Engine wear debris
- Metallic inclusions
- Pharmaceutical powders
- Environmental particles
SmartPI™ software is also available for use on the EVOŽ, ULTRA and SUPRATM Scanning Electron Microscopes from Carl Zeiss SMT.
ParticleSCAN is a turnkey system designed for use in a process monitoring and production environment applications to drive manufacturing capability and yield improvements.
ParticleSCAN is a rugged and mobile Scanning Electron Microscope with minimal environmental constraints that can be rapidly installed on site. Combined with an optional X-Ray analysis system (EDS) the SmartPI™ software can automatically measure, classify and record size, shape and chemical composition of particle samples. With a production mode interface wizard non-skilled operators can load samples and select a preset routine for unattended analysis and reporting. SmartPITM then completes self-calibration and set-up routines before automatically analysing all of the required samples.
ParticleSCAN is an extremely broad and flexible platform. The SmartPI™ configuration mode allows the user to select and modify all of the analysis parameters including SEM operation, preset sample holders, image processing, EDS parameters, particle classification and report generation. Each of these components can be edited individually or selected from preset functions to build a complete analysis routine.
Particle data from the analysis are delivered in a custom report or a flexible database containing all the selected parameters. Data can be retrospectively re-processed with refined particle selection criteria, classifications or characteristics. Particle images of specific interest can be reviewed off line, re-measured or re-located on the original sample for further analysis if required. | |
Brochures & Flyers
He-Ion, SEM, FE-SEM, FIB, TEM and NTS Division Literature |