Particle Analysis

포트폴리오 SmartPITM The Complete Automated Analysis Solution ParticleSCAN VP ParticleSCAN VP with SmartPI™ User Interface JetSCAN® JetSCAN® with SmartPI™ User Interface 더 많은 정보 Brochures & Flyers He-Ion, SEM, FE-SEM, FIB, TEM and NTS Division Literature

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Particle Analysis Frequently repeated analysis of material samples in industrial production and research environments gains more and more importance as requirements for cleanliness increase while at the same time particles get smaller and smaller. Particle analysis comprises the detection and characterisation of particles using analytical determination of the morphology (i.e. size and shape) in combination with the classification of the chemical composition using energy dispersive X-ray analysis The extremely powerful software package SmartPITM is compatible to all ZEISS SEM FE-SEM CrossBeam (FIB-SEM)Workstations Helium Ion Microscopes Feel free to contact us for further information!