Field Emission Scanning Electron Microscopes

ΣIGMA – Key Benefits Analytical Platform Simultaneous EDS and EBSD analysis Universal WDS port as standard providing flexibility for a comprehensive range of accessories Extended stage travel for handling of large specimen Class leading analytical and X-ray geometry Best in class imaging with GEMINI® Technology Outstanding imaging and ease of use using the high performance GEMINI® column High purity, In-lens, SE detection for true surface imaging Excellent imaging at low voltages for beam sensitive and non-conducting specimen Investigation of magnetic samples with GEMINI® objective lens design for distortion free imaging Ease of Use Unique column design providing superb imaging for both experts and novices alike Advanced Navigation allowing for high productivity and throughput SmartSEM® Interface for intuitive operation of the SEM FESEM providing unrivaled versatility Advanced VP technology for exceptional imaging and analysis of non-conductive specimen Seamless switching between high vacuum and variable pressure vacuum modes Upgradeability with large range of Carl Zeiss detectors

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