Granite rock, where the ROI was observed in a light microscope.

Granite rock, where the relocated ROI was observed with an SEM.

Granite rock, where the same relocated ROIs were overlapped with the Shuttle & Find correlative solution.

Light microscope image of Granite rock, where the relocated ROI is extended by the corresponding SEM (BSE detector) image.

Metallic particle with complex chemical composition in a light microscope.

Relocated metallic particle with complex chemical composition observed in SEM (BSE).

Metallic particle with complex chemical composition, where the light microscope image is overlaid with corresponding EDS maps by the Shuttle & Find correlative solution.

Overlap of the typical particle filter images obtained in light and scanning electron microscopes with Shuttle & Find.

Light microscope image of Austempered Ductile Iron (ADI) with the precipitation on the surface. Sample courtesy of ZHAW Institute of Materials and Process Engineering, Winterthur, Switzerland.

BSE image of Austempered Ductile Iron (ADI) with the precipitation on the surface relocated in the SEM (BSE). Sample courtesy of ZHAW Institute of Materials and Process Engineering, Winterthur, Switzerland.

Light microscope image of typical automotive particle filter for identification of technical cleanliness.

SEM (BSE) image of typical automotive particle filter for identification of technical cleanliness (relocated ROI).

Light microscope image of Suevite breccia, where the relocated ROI is extended by EDS map in Shuttle & Find.

SEM BSE image of Suevite breccia, where the relocated ROI is extended by the corresponding light microscope image in Shuttle & Find.

Light microscope image of Suevite breccia, where the entire image is overlapped with EDS map (Fe) and the relocated ROIs are extended by the corresponding SEM (BSE detector) images in Shuttle & Find.

Overlap of the semiconductor sample images obtained in light and scanning electron microscopes with Shuttle & Find.