ZEISS Xradia CrystalCT

첫 상용화된 결정학적 이미징 마이크로 CT 시스템을 만나보세요.

ZEISS Xradia CrystalCT is your ground-breaking microCT for unlocking the crystallographic and microstructural secrets of your samples. It uniquely augments the powerful technique of computed tomography with the ability to reveal crystallographic grain microstructures, transforming the way polycrystalline materials (such as metals, additive manufacturing, ceramics, etc.) can be studied, leading to newer and deeper insights into materials research.

product image ZEISS Xradia CrystalCT
  • Perform non-destructive mapping of grain morphology in 3D.
  • Characterize materials such as metals, alloys, and ceramics.
  • Map larger volumes and a wider array of sample geometries at higher throughput.
  • Advance materials characterization and discovery through ground-breaking diffraction scanning modes.
  • Achieve superior sample representivity to create high fidelity computational models.

하이라이트

DCT projection geometry schematic
Schematic illustration of CrystalCT projection geometry. CrystalCT delivers dual modalities: absorption contrast tomography (ACT) and diffraction contrast tomography (DCT)

연구의 가능성을 확장시키는 DCT

ZEISS Research Microscopy Solutions and Xnovo Technology have partnered to deliver revolutionary laboratory diffraction contrast tomography (DCT) capability. Using 3D grain mapping, DCT on a microCT brings the ability to image single-phase polycrystalline materials within reach of technical and industrial research labs, covering a wide range of metal, mineral, ceramic, semiconductor, and pharmaceutical samples in 3D. The purpose-built ZEISS Xradia CrystalCT incorporates precisely designed aperture and beam stop assemblies to harness divergent, polychromatic X-ray beams to illuminate a region of interest and increase sensitivity to weaker diffraction signals of polycrystalline samples. Innovative DCT acquisition modes remove the limitations for larger sample sizes, providing you with the ability to research more sample types. Seamless large volume grain mapping enables scanning samples faster and with more accurate representation of data.


Aluminum “dogbone” imaged with DCT
Al-4wt%Cu sample with gauge section dimension of (length) 1.25 mm, (width) 1.0 mm and (thickness) 0.5 mm. Sample scanned using helical phyllotaxis HART.

향상된 회절스캔모드로 놀랍게 개선된 표본 대표성

ZEISS Xradia CrystalCT advances materials characterization, modeling, and discovery through ground-breaking diffraction scanning modes.

  • Provides unprecedented sample representivity.
  • Enables scanning larger sample volumes.
  • Simplifies sample prep and handling of irregular/natural sample shapes.
  • Increases speed.
  • Addresses sample specificity.

These advanced modes overcome some of the previous challenges of conventional DCT data collection that assume the sample ROI is fully illuminated by the aperture field of view (FOV) for all rotational angles of the sample. Inspired by nature’s golden angle, advanced diffraction scanning modes deliver helical phyllotaxis schema to manage a wide range of sample shapes and sizes.


Steel-reinforced concrete microCT image
Quantitative volumetric analysis of a steel reinforced concrete specimen. Voids are rendered in purple.

강력한 MicroCT 플랫폼

ZEISS leverages its powerful Xradia technology to deliver world-leading performance on a microCT. With a robust stage, flexible software-controlled source/sample/detector positioning, and a large array detector, you can obtain high quality, high resolution scans with best-in-class contrast. Image entire objects or devices to reveal interior details in their full 3D context. Faster acquisition speeds enable you to run samples in a shorter time, increasing your productivity and profitability. Non-destructive CT also enables in situ and 4D studies to understand practically the impact of varying conditions over time. The ZEISS Xradia imaging system combines its proven hardware architecture with state-of-the-art stability and drift compensation features. It is because of the superior stability of this renowned platform that CrystalCT consistently surpasses one’s comprehension of what a microCT can achieve.


[Achtung!]

[Die Inhalte der Columns oberhalb und unterhalb dieses Kommentars sind völlig identisch. Oberhalb ist für Mobile View zuständig, unterhalb für Desktop View.]

연구의 가능성을 확장시키는 DCT

ZEISS Research Microscopy Solutions and Xnovo Technology have partnered to deliver revolutionary laboratory diffraction contrast tomography (DCT) capability. Using 3D grain mapping, DCT on a microCT brings the ability to image single-phase polycrystalline materials within reach of technical and industrial research labs, covering a wide range of metal, mineral, ceramic, semiconductor, and pharmaceutical samples in 3D. The purpose-built ZEISS Xradia CrystalCT incorporates precisely designed aperture and beam stop assemblies to harness divergent, polychromatic X-ray beams to illuminate a region of interest and increase sensitivity to weaker diffraction signals of polycrystalline samples. Innovative DCT acquisition modes remove the limitations for larger sample sizes, providing you with the ability to research more sample types. Seamless large volume grain mapping enables scanning samples faster and with more accurate representation of data.

향상된 회절스캔모드로 놀랍게 개선된 표본 대표성

ZEISS Xradia CrystalCT advances materials characterization, modeling, and discovery through ground-breaking diffraction scanning modes.

  • Provides unprecedented sample representivity.
  • Enables scanning larger sample volumes.
  • Simplifies sample prep and handling of irregular/natural sample shapes.
  • Increases speed.
  • Addresses sample specificity.

These advanced modes overcome some of the previous challenges of conventional DCT data collection that assume the sample ROI is fully illuminated by the aperture field of view (FOV) for all rotational angles of the sample. Inspired by nature’s golden angle, advanced diffraction scanning modes deliver helical phyllotaxis schema to manage a wide range of sample shapes and sizes.

강력한 MicroCT 플랫폼

ZEISS leverages its powerful Xradia technology to deliver world-leading performance on a microCT. With a robust stage, flexible software-controlled source/sample/detector positioning, and a large array detector, you can obtain high quality, high resolution scans with best-in-class contrast. Image entire objects or devices to reveal interior details in their full 3D context. Faster acquisition speeds enable you to run samples in a shorter time, increasing your productivity and profitability. Non-destructive CT also enables in situ and 4D studies to understand practically the impact of varying conditions over time. The ZEISS Xradia imaging system combines its proven hardware architecture with state-of-the-art stability and drift compensation features. It is because of the superior stability of this renowned platform that CrystalCT consistently surpasses one’s comprehension of what a microCT can achieve.

응용 분야

금속 세라믹, 반도체, 지질학, 약학, 그리고 더 많은 분야들.

ZEISS Xradia CrystalCT delivers cutting edge, radically different diffraction scanning technology, uniquely offering the ability to map grain boundary surfaces over significantly larger volumes in their native state while targeting realistic sample geometries that suit the common requirements of research and industrial labs. Unlike other grain mapping technologies, DCT enables non-destructive 3D grain imaging.

Grain map of aluminum-copper alloy
3D grain map of aluminum copper alloy imaged in absorption and diffraction contrast tomography.

재료과학

  • Complementary information from high resolution absorption contrast tomography and non-destructive 3D grain mapping delivering size, shape, orientation, and grain boundary information.
  • Non-destructive insights into interior microstructures and overlaid grain maps not visible by surface imaging methods such as optical or scanning electron microscopy.
  • Ability to segment and analyze data to obtain quantitative, 3D descriptions of structures and particles.
  • 4D imaging through ex situ or in situ experiments to see how materials evolve, e.g., through mechanical load or corrosion.

Ultra-thin steel sample imaged with advanced scanning modes
3D grain map of an ultra-thin oriented electrical steel sample with dimension of (RD) 4 mm, (TD) 2 mm and (ND) 0.08 mm.

금속 & 광물

  • Understand grain size and phase evolution in 3D for insight into alloy performance and its dependence on thermal and mechanical processes.
  • Export real 3D structures for physics simulations: predict materials properties (mechanical, thermal, etc.) or digital rock simulations using non-destructive 3D tomography data imaging, characterization, and modeling of rock cores (up to 4”) with high throughput.
  • High contrast 3D imaging for in situ flow studies or 3D mineralogy.

Semiconductor-solar panel imaged in high aspect ratio tomography mode
3D grain map of polysilicon materials from a solar panel with height of 30 mm.

제조

  • Accommodate a range of sample sizes including large objects in their full 3D context, complementing with 3D grain maps in specific applications.
  • Perform crystallography-based print quality assessment in 3D printed metal parts.
  • High throughput scanning of intact devices with fast time to results.
  • Complement or replace physical cross sectioning and eliminate the need to sacrifice your sample.

Intact mouse model imaged with microCT
2D virtual cross-section and a cutaway view of 3D rendering of a mouse embryo embedded in paraffin.

생명과학

  • Image either stained or unstained hard and soft tissues and biological microstructures with high contrast.
  • Quick, non-destructive verification of sample staining and location of features for subsequent imaging using 3D electron microscopy.

[Achtung!]

[Die Inhalte der Columns oberhalb und unterhalb dieses Kommentars sind völlig identisch. Oberhalb ist für Mobile View zuständig, unterhalb für Desktop View.]

재료과학

  • Complementary information from high resolution absorption contrast tomography and non-destructive 3D grain mapping delivering size, shape, orientation, and grain boundary information.
  • Non-destructive insights into interior microstructures and overlaid grain maps not visible by surface imaging methods such as optical or scanning electron microscopy.
  • Ability to segment and analyze data to obtain quantitative, 3D descriptions of structures and particles.
  • 4D imaging through ex situ or in situ experiments to see how materials evolve, e.g., through mechanical load or corrosion.

금속 & 광물

  • Understand grain size and phase evolution in 3D for insight into alloy performance and its dependence on thermal and mechanical processes.
  • Export real 3D structures for physics simulations: predict materials properties (mechanical, thermal, etc.) or digital rock simulations using non-destructive 3D tomography data imaging, characterization, and modeling of rock cores (up to 4”) with high throughput.
  • High contrast 3D imaging for in situ flow studies or 3D mineralogy.

제조

  • Accommodate a range of sample sizes including large objects in their full 3D context, complementing with 3D grain maps in specific applications.
  • Perform crystallography-based print quality assessment in 3D printed metal parts.
  • High throughput scanning of intact devices with fast time to results.
  • Complement or replace physical cross sectioning and eliminate the need to sacrifice your sample.

생명과학

  • Image either stained or unstained hard and soft tissues and biological microstructures with high contrast.
  • Quick, non-destructive verification of sample staining and location of features for subsequent imaging using 3D electron microscopy.

인사이트

뛰어난 표본 대표성

Sample Representivity Diagram

표본 대표성 - 대용량의 실 데이터를 확보해 기존 결정학적 이미징에서 어려웠던 높은 정확도의 계산 모형을 만들 수 있습니다. 

ZEISS Xradia CrystalCT offers advanced DCT modes that overcome some of the previous challenges of conventional DCT data collection that assumes the ROI in the sample is fully illuminated by the aperture field of view (FOV) for all rotational angles of the sample.

ZEISS Xradia CrystalCT advanced diffraction scanning modes include

  • Helical Phyllotaxis
    Helical phyllotaxis rotation is used for long aspect ratio cylindrical samples.
  • Helical Phyllotaxis Raster
    Helical phyllotaxis raster is used for samples that are typically wider than the field of view.
  • Helical Phyllotaxis HART
    Phyllotaxis with high aspect ratio tomography, or HART, solves the problem of flat or plate-like sample imaging.

3D Grain Reconstruction

Index grain data precise, fast & automated

After the initial acquisition as the first step in your workflow you then start to reconstruct. Load your absorption tomography and your diffraction data into GrainMapper3D. Let it identify potential candidates for grain orientations of a given polycrystal by using back and forward projections.

An automated, iterative search for grains in the sample volume is your next step. Grain reconstruction results are stored as stacks of slices or volume datasets that contain the full description of the indexed grains. Eventually, share 3D LabDCT results with your collaborators or customers using the standalone GrainMapper3D Viewer application.

3D Grain Mapping

3D Grain Mapping

Get all information in one file

Your final step is to get out all the information you need in one single file. Shape, orientation and spatial locations of all grains in the sample volume are exported into an open data format.

Finish your experiment with subsequent analyses using customized software or simulation tools. The advanced indexation routines now support the more complex lower symmetry crystal systems.

What is Artificial Intelligence?
For more information click to enlarge the graphic
What is Artificial Intelligence?
For more information click to enlarge the graphic

Advanced Reconstruction Toolbox (ART) introduces Artificial Intelligence (AI)-driven reconstruction technologies on your ZEISS Xradia 3D X-ray microscope (XRM) or microCT. A deep understanding of both X-ray physics and applications enable you to solve some of the hardest imaging challenges in new and innovative ways.

Discover how speed of data acquisition and reconstruction as well as image quality are enhanced without sacrificing resolution by using OptiRecon, two variants of DeepRecon and PhaseEvolve, the unique modules of ART.

With the Advanced Reconstruction Toolbox, you are able to:

  • Improve data collection and analysis for accurate and faster decision-making
  • Greatly enhance image quality
  • Achieve superior interior tomography or throughput on a broad class of samples
  • Reveal subtle difference through improved contrast-to-noise
  • Increase speed at an order of magnitude for sample classes requiring repetitive workflow

 

3D X-ray dataset of a camera lens acquired using ZEISS Xradia 620 Versa and DeepRecon Pro.

ZEISS OptiRecon for iterative reconstruction

Similar results, 4x faster

ZEISS OptiRecon is an implementation of iterative reconstruction that greatly increases acquisition throughput, while optimizing image quality.
 

  • Achieve up to 4× faster scan times or enhanced image quality with equivalent throughput.
  • Benefit from this economical solution offering superior interior tomography or throughput on a broad class of samples.
     
Observe the performance of OptiRecon in a workflow performed on an electronics sample.
Observe the performance of OptiRecon in a workflow performed on an electronics sample. Analyze integration issues in a smart phone camera lens, now 4× faster. Left: Standard reconstruction: Scan time 90 minutes (1200 projections). Center: Standard reconstruction: Scan time 22 minutes (300 projections). Right: OptiRecon: Scan time 22 minutes (300 projections).
Mobile phone camera module demonstrating 4X throughput improvement with comparable image quality
Mobile phone camera module demonstrating 4X throughput improvement with comparable image quality

Slide right to left to compare:

Standard Reconstruction #300Zoom OptiRecon #300Zoom
Standard Reconstruction
OptiRecon

Application Examples

4X Throughput for Mining Powder

Flexibility for Rock Exploration 
– Image Quality vs. Throughput

4X Throughput for Battery Research

Flexibility for Battery Research
– Image Quality vs. Throughput

2X Throughput for 2.5D Semiconductor Package (50 mm x 75 mm)

Improved Image Quality for 2.5D Semiconductor Package (50 mm x 75) 

2X Throughput for Semiconductor Package

Improved Image Quality for Semiconductor Package


ZEISS DeepRecon Pro & Custom for Deep learning-based reconstruction

Increase the speed of your data acquisition with reconstruction technology

DeepRecon technology is offered in two forms - DeepRecon Pro and DeepRecon Custom - both leveraging AI and enhancing image quality and speed. Increase throughput without sacrificing RaaD (resolution-at-a-distance). Alternatively, keep the same number of projections and enhance the image quality further.

DeepRecon Pro used for throughput improvement for Ceramic Matrix Composite (CMC) sample, achieving 10× throughput improvement without sacrificing image quality. This would allow for much higher temporal resolution for in situ studies. Left: Standard reconstruction (FDK): Scan time 9 hrs (3001 projections). Center: Standard reconstruction (FDK): Scan time 53 mins (301 projections). Right: DeepRecon Pro: Scan time 53 mins (301 projections).

Find out the difference:

  • With DeepRecon Pro you benefit from superior throughput and image quality across a wide range of applications.
  • It enables you to reveal subtle differences in the images of your samples through improved contrast-to-noise.
  • Increase the speed of your data acquisition up to 10x for sample classes requiring a repetitive workflow.
  • Apply DeepRecon Pro to unique samples, to semi-repetitive and repetitive workflows.
  • Now you can self-train new machine learning network models on-site with an easy-to-use interface.
  • The need for a machine learning expert is thus eliminated and DeepRecon Pro can be seamlessly operated by even a novice user.
  • ZEISS DeepRecon Custom is targeted specifically for repetitive workflow applications to further boost XRM performance beyond DeepRecon Pro.
  • ZEISS collaborates closely with users to develop custom-created network models that fit their repetitive application needs precisely.

Application Examples

Ceramic Matrix Composite (CMC) - 10X Throughput Improvement

10X throughput improvement without sacrificing image quality.

Smartwatch Battery - 4X Throughput Improvement

4X throughput improvement while maintaining detail in cathode particles.

Smartwatch Battery - Image Quality Improvement

Enhanced image quality to see low contrast graphite particles

21700 Cylindrical Cell Battery - 8X Throughput Improvement

8X throughput improvement with comparable image quality

2.5D Semiconductor Interposer Package – 4X Throughput Improvement

4X throughput improvement while retaining 1 µm crack

2.5D Semiconductor Interposer Package – Improved Image Quality

Improved image quality with same scan time.

Sandstone Core – 6X Throughput Improvement

6X throughput improvement with improved image quality and reduced imaging artefact in the imaging of sandstone rock cores enables more accurate segmentation, quantification and simulation.

SmartShield

Easily Protect Your Sample to Optimize Experiment Setup

SmartShield is a solution that protects your sample and your microscope. This automated collision avoidance system works within the Scout and Scan Control System. It enables you to navigate Xradia platforms more confidently than ever. How it works - with the click of a button SmartShield creates a digital protective layer based on the dimensions of your sample.

SmartShield lets you benefit from:

  • Improved operator efficiency enabled by a streamlined sample setup
  • Enhanced user experience for novice and advanced users
  • Protecting your valuable samples and your investment
  • Uncompromising scan quality
Watch this video and gain insights into the workflow guided by SmartShield.

악세사리

in situ experiments

Push the limits for scientific advancement

ZEISS Xradia X-ray systems provide the industry’s premier 3D imaging solution for the widest variety of in situ rigs, from high pressure flow cells to tension, compression and thermal stages.

Moving beyond the three dimensions of space, leverage the non-destructive nature of X-ray investigation to extend your studies into the dimension of time with 4D experiments. ZEISS Xradia microCT platforms can accommodate a variety of in situ rigs, from high pressure flow cells to tension, compression and thermal stages, to user-customized designs. You can add the optional in situ Interface Kit to your ZEISS Xradia CrystalCT, which includes a mechanical integration kit, a robust cabling guide and other facilities (feed-throughs) along with recipe-based software that simplifies your control from within the Scout-and-Scan user interface. When your needs require pushing the resolution limits of your in situ experiments, convert your ZEISS Xradia CrystalCT to an Xradia 620 Versa X-ray microscope to leverage Resolution at a Distance (RaaD) technology for the maximum performance tomographic imaging of samples within in situ chambers or rigs.

Tensile testing of laser welded steel under increasing load.
Tensile testing of laser welded steel under increasing load.

Autoloader

Increase your sample handling efficiency

Maximize your instrument's utilization with the optional Autoloader, available for all instruments in the ZEISS X-ray microscope platforms. Reduce the frequency of user interaction and increase productivity by queueing multiple jobs. Load up to 14 sample stations, which can support up to 70 samples, and set to run overnight, or across multiple days. Unprecedented mechanical stability enables high volume quantitative repetitive scanning of like samples.

Autoloader option enables you to program up to 70 samples at a time to run sequentially.
Autoloader option enables you to program up to 70 samples at a time to run sequentially.

Software

Create Efficient Workflows by Using The Simple Control System

Easily scout a region of interest and specify scanning parameters within the Scout-and-Scan Control System. Take advantage of the easy-to-use system in your central lab where users may have a variety of experience levels.

Benefit from:

  • Internal camera for sample viewing
  • Recipe control (set, save, recall)
  • Multiple energies
  • Multiple samples with Autoloader option
  • Micropositioning capability with a simple mouse click
Scout-and-Scan Control System
Scout-and-Scan Control System
Lithium-ion Battery
Lithium-ion Battery

Visualization and Analysis Software

ZEISS recommends Dragonfly Pro from Object Research Systems (ORS)
An advanced analysis and visualization software solution for your 3D data acquired by a variety of technologies including X-ray, FIB-SEM, SEM and helium ion microscopy.
Available exclusively through ZEISS, ORS Dragonfly Pro offers an intuitive, complete, and customizable toolkit for visualization and analysis of large 3D grayscale data. Dragonfly Pro allows for navigation, annotation, creation of media files, including video production, of your 3D data. Perform image processing, segmentation, and object analysis to quantify your results.

more

ZEISS ZEN Intellesis for Image Segmentation in Microscopy

ZEISS ZEN Intellesis for Image Segmentation in Microscopy

Use the power of deep learning to easily segment your images and to get access to their real value - the data they provide. Image segmentation lays the foundation for all subsequent image analysis steps. ZEISS ZEN Intellesis uses deep learning and Python to easily create reproducible segmentation results, even for non-experts. Train the software once and then ZEISS ZEN Intellesis can segment a batch of hundreds of images automatically. You save time and minimize user bias.

Learn more about ZEISS ZEN Intellesis for Image Segmentation in Microscopy

문의하기

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