ZEISS @ ICC8 | Virtual Congress
25th - 30th April 2021
Welcome to ZEISS @ ICC8.
Ceramics have become the material of choice for a wide range of high performance applications thanks to the ability to design their macroscopic properties and combine these with modern processing techniques. In today’s fast moving environment, increasing the efficiency of products, meeting challenging customer demands, and reducing production costs while keeping ahead of the competition can be a challenge without an analytical approach.
ZEISS’ powerful portfolio of 2D analytical characterization technologies combined with 3D non-destructive imaging and in situ capabilities, equips researchers with an unparalleled toolkit to pioneer solutions and further advance ceramics research and development. Combining innovative software packages for modeling, simulation and artificial intelligence,
Discover more about ZEISS' solutions for microscopy and unlock the power to engineer new ceramic material properties by filling in the form below.
Download Resources For Ceramics Research
- Advanced Segmentation for Industrial Materials
- Enabling Premium 3D Crystallographic Imaging in Your Laboratory
- 3D Submicron Imaging of Cracking in Building Materials
- Engineering Ceramics from Nanoparticles to Finished Goods
- Advanced Materials - Ceramics
- Materials Testing and Development at Corning Inc. Using XCT Technology
Register and access resources
ZEISS Solutions for Ceramics Research
ZEISS Xradia CrystalCT
Your ground-breaking microCT for unlocking the crystallographic and microstructural secrets of your samples
ZEISS Xradia CrystalCT is the first commercially available crystallographic imaging microCT system. It uniquely augments the powerful technique of computed tomography with the ability to reveal crystallographic grain microstructures, transforming the way polycrystalline materials (such as metals, additive manufacturing, ceramics, etc.) can be studied, leading to newer and deeper insights into materials research.
ZEISS Xradia Versa Series
3D X-ray Microscopy for Faster Sub-Micron Imaging of Intact Samples
Use the combination of resolution and contrast with flexible working distances to extend the power of non-destructive imaging in your lab. Benefit from its architecture that uses a two-stage magnification technique to achieve submicron resolution at a distance (RaaD). Reducing dependence upon geometric magnification maintains submicron resolution even at large working distances.
ZEISS GeminiSEM Series
Discover the Unknown with Ultimate Imaging and Effortless Analytics
ZEISS GeminiSEM stands for effortless imaging with sub-nanometer resolution. Use it for your most demanding projects in materials and life science. Innovations in electron optics and a new chamber design let you benefit from better image quality, usability and flexibility. Combine excellence in imaging and analytics. Take sub-nanometer images below 1 kV without an immersion lens. Discover three unique designs of the Gemini electron optics. Explore, how the GeminiSEM family answers all your imaging and analytical needs.
Your FIB-SEM for High Throughput 3D Analysis and Sample Preparation
Combine imaging and analytical performance of a high resolution field emission scanning electron microscope (FE-SEM) with the processing ability of a next-generation focused ion beam (FIB). You may be working in a multi-user facility, as an academic or in an industrial lab. Take advantage of ZEISS Crossbeam’s modular platform concept and upgrade your system with growing needs, e.g. with the LaserFIB for massive material ablation. During milling, imaging or when performing 3D analytics Crossbeam will speed up your FIB applications.