
ZEISS @SEMICON Korea 2021
Accelerate New Processes for Next-generation Devices
Welcome to the ZEISS Virtual booth in lieu of SEMICON 2021
Discover and learn more about our latest microscopy solutions for the semiconductor industry.



Highlights
- High-resolution semiconductor imaging and characterization: ZEISS GeminiSEM FE-SEM
- Femtosecond laser FIB that quickly finds defects inside IC packages: ZEISS Crossbeam Laser FIB-SEM
- Package structure analysis and non-destructive imaging: ZEISS Xradia Versa 3D X-ray Microscopes