Accelerate New Processes for Next-generation Devices

Welcome to the ZEISS Virtual booth in lieu of SEMICON 2021
Discover and learn more about our latest microscopy solutions for the semiconductor industry.


  • High-resolution semiconductor imaging and characterization: ZEISS GeminiSEM FE-SEM
  • Femtosecond laser FIB that quickly finds defects inside IC packages: ZEISS Crossbeam Laser FIB-SEM
  • Package structure analysis and non-destructive imaging: ZEISS Xradia Versa 3D X-ray Microscopes

This event has ended. Please view the video below for more information about ZEISS Semiconductor Solutions.